Semiconductor Engineering

No-Compromise Packetized Test Improves DFT Efforts

Design for Test (DFT) managers often must make difficult and sometimes costly trade-offs between test implementation effort and manufacturing test cost. The traditional method for evaluating these ...
Electronic Design

CTL: The New Language of DFT

What is CTL, and why is it important to the semiconductor industry? The answers are here. Although the IEEE 1450.0 Stand-ard Test Interface Language (STIL) was adopted in March 1999, widespread ...
Semiconductor Engineering

A Practical Approach To DFT For Large SoCs And AI Architectures, Part I

The traditional processors designed for general-purpose applications struggle to meet the computing demands and power budgets of artificial intelligence (AI) or machine leaning (ML) applications.
Electronic Design

A Methodology to Speed DFT Signoff

Shipping high-quality ICs requires that design-for-test (DFT) methodologies be included in a design. DFT provides external access at the device’s I/O pins to internal registers to either control or ...
EDN

Pre-configured DFT structures can simplify ASIC design, verification

Steven Kawamoto, Sr. Marketing Manager, Custom LSI Solutions Unit, Gaku Ogura, Sr. Marketing Manager, Design Solutions Center, Richard Lee, Design Engineer, Design ...