D scanners rely on being able to identify physical features of an object, and line up what it saw a moment ago with what it ...
Abstract: This paper analyses and evaluates the cross-scan error of a large-size polygon mirror-based laser scanning system for industrial stereolithography (SLA ...
Abstract: Atomic Force Microscope (AFM) has remained one of the most prominent morphology tools for examining the microscopic world. However, the 3D-AFM has several disadvantages. First, the physical ...
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